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ICP-OES MICS DV Inductively Coupled Plasma Emission Spectrometer
Description:
The LIBS handheld analyzer makes up for the shortcomings of traditional elemental analysis methods, especially in applications such as material analysis in small areas, coating/film analysis, defect detection, jewelry identification, forensic evidence identification, powder material analysis, alloy analysis, etc. At the same time, LIBS can also be widely applied in different fields such as geology, coal, metallurgy, pharmaceuticals, environment, and research. Besides traditional laboratory applications, LIBS is one of the few elemental analysis technologies that can be made into handheld portable devices, and it is also an elemental analysis technology that can be used for online analysis. This will enable the analysis technology to expand from the laboratory field to outdoor and on-site environments.
The development history of handheld LIBS full-element analyzers
Since the LIBS concept was first proposed in the 1960s, this technology has been recognized as a promising new technology, which will bring numerous innovative applications to the field of analysis. It has always been applied in the forefront of scientific research. In the past decade or so, the continuous development of laser technology and spectroscopy technology has provided the hardware foundation for LIBS technology to be popularized from a research laboratory analysis technology to a practical analysis instrument for industrial sites.
The current situation of handheld LIBS analyzers
Dr. Don Sackett, an American who has been dedicated to developing practical elemental analysis technologies for industrial sites, and his research team, after successfully developing and achieving market success with the Innov-X handheld Alpha series XRF analyzer, Omega series XRF analyzer, and Delta series analyzer, since 2010, have focused their attention on the research and development of LIBS on-site analysis technology. It took six years and cost over 100 million US dollars. In March 2017, they launched a handheld carbon steel analyzer in the US market, achieving success. At the product launch event, a large number of orders were received; in June, they achieved the same success in the European market; in September, they entered the Chinese market, and have already received orders from institutions such as the Chinese Academy of Sciences and Sin opec. At one point, there was a shortage of supply.
Handheld LIBS Analyzer Technology
LIBS is the abbreviation of Laser-Induced Breakdown Spectroscopy. This technology uses a focused pulsed laser to create plasma on the surface of the sample. The spectral analyzer is then used to analyze the emitted light spectrum from the plasma, thereby identifying the elemental composition of the sample. This enables material identification, classification, qualitative and quantitative analysis.
Summary of the features of the handheld LIBS analyzer technology
The LIBS analysis technology compensates for the shortcomings of traditional industrial field elemental analysis technologies such as handheld fluorescence machines and portable spark-readout machines with its unique performance. Together with handheld X-ray fluorescence machines and portable spark-readout machines, it has become an essential equipment for on-site elemental analysis. It is also the new favorite for professionals engaged in on-site aluminum alloy analysis, alloy steel analysis, and carbon steel analysis.
Features
Safe, without radiation, overcoming the shortcomings of traditional element analysis techniques in industrial sites
It has a fast analysis speed and is easy to operate.
*Light-element analysis performance, traditional element analysis techniques in industrial settings
*The test beam has a small size, making it particularly suitable for material analysis in tiny areas and coating film analysis. This is the advantage of LIBS.
*It can simultaneously analyze multiple elements, integrating the advantages of traditional on-site elemental analysis technologies.
*The diversity of matrix forms enables the detection of almost all solid samples.
*It is safe without X-ray radiation.
There is no need to apply for a radiation instrument usage license from the environmental protection bureau, nor is it necessary to hire a third-party environmental assessment company to issue an environmental assessment report for the radiation instrument every year.
1.Users can operate with peace of mind, without worrying about irreversible physical damage caused by radiation accumulation.
2. Quickly identify the alloy type. For aluminum alloys, it only takes 1-2 seconds.
3. One-click design, the operation is extremely simple and does not require professional operation;
4. It can quickly determine light elements such as C, H, Li, Be, B, etc. Users can select the appropriate analysis curve and configuration as needed.
5. High-definition cameras, combined with laser beams, enable precise analysis of micro areas;
6. The Android intelligent operating system allows for the seamless loading of new APP application software at any time.
7. Long standby mode, equipped with two rechargeable lithium batteries. Each battery can provide continuous testing for at least 6 hours.
8. Quickly generate reports and share test results with a single click;
9. Sapphire test window, with high strength, effectively preventing damage to the window film;
10. The maintenance cost is low, and there are no expensive and easily damaged parts similar to those of XRF detectors.
Applications
The inductively coupled plasma atomic emission spectrometer is currently the mainstream method for inorganic element analysis in laboratories. It has the characteristics of multiple testable elements, fast testing speed, low detection limit, and wide measurement range. It can be widely applied in numerous fields such as environmental protection, geological and mineral resources, precious metals, petrochemicals, new energy and new materials, high-purity substances, toys and consumer goods, food and cosmetics, etc. The product detection methods are mostly recognized testing methods approved by national standards and industry standards.
ICP-OES MICS DV Inductively Coupled Plasma Emission Spectrometer
Category | Parameter | Specification |
Sample Introduction | Nebulizer | High-efficiency concentric nebulizer |
Spray Chamber | Cyclonic spray chamber | |
Torch | 3-turn vertical integrated torch | |
Peristaltic Pump | 5-channel/16-roller, corrosion-resistant • Sample/Waste/IS/Diluent/Hydride feeds • Speed adjustable with fast rinse |
|
Gas System | MFC-controlled flows: • Coolant: 0.00-20.00 L/min (0.01L/min step) • Auxiliary: 0.00-2.00 L/min • Carrier: 0.00-2.00 L/min • Ar consumption: 8-18 L/min Options: O2-assisted organic sampling, Ar humidification |
|
RF Generator | Type | Solid-state, 27.12 MHz, self-excited |
Power | 500-1600 W (1W step), >85% coupling efficiency | |
Stability | Power ≤0.01%, Frequency ≤0.01% | |
Operation | One-touch ignition/extinction EM radiation: <0.5 V/m |
|
Plasma Source | Tail Flame Control | Cold cone technology (no air compressor needed) |
Standby Mode | Low-power operation with reduced gas flow | |
Optics | Viewing Mode | Dual axial/radial observation |
Grating | Echelle, 52.67 gr/mm, 63.5° blaze | |
Prism | Ultra-pure CaF2 | |
Wavelength Range | 165-950 nm | |
Focal Length | 400 mm | |
Resolution | ≤0.007 nm @ 200 nm | |
Stray Light | <2 μg/ml Ca @ As 189.042 nm (10,000 μg/ml background) | |
Thermostatic Control | 38°C (±0.1°C) | |
Purge System | Multi-point purge (1L/min low, 4L/min high) - no vacuum pump | |
Detection | Calibration | Background spectrum-based (no external lamps) |
Detector | Back-illuminated CCD with: • TE cooling (-45°C in <3 min) • Anti-blooming • 75% QE, no coating • 1024×1024 pixels (24μm²) |
|
Readout | Full-spectrum single exposure (25.4×25.4 mm area) | |
Smart Integration | Auto time adjustment for wide dynamic range | |
Software | Language Support | Chinese/English/Russian |
Analysis Modes | Qualitative/Semi-quant/Quantitative | |
Spectral Library | ≥70,000 lines with interference alerts | |
Calibration | Multi-mode: Standard curve, standard addition, "sandwich" method | |
Corrections | Blank subtraction, ISC, IEC interference correction | |
Security | Password protection | |
Report Formats | Multiple output options | |
Performance | Short-term Stability (RSD) | ≤0.5% |
Long-term Stability (RSD) | ≤1.0% | |
Dynamic Range | ≥105(Mn 257.6nm, R²≥0.999) | |
Detection Limits (μg/L) | Zn 213.856 nm | 1 |
Ni 231.604 nm | 2 | |
Mn 257.610 nm | 0.2 | |
Cr 267.716 nm | 1 | |
Cu 324.754 nm | 1 | |
Ba 455.403 nm | 0.2 |